000 02857nam a22004093i 4500
001 EBC31471650
003 MiAaPQ
005 20250825095851.0
006 m o d |
007 cr cnu||||||||
008 250807s2024 xx o ||||0 eng d
020 _a9783031586538
_q(electronic bk.)
020 _z9783031586521
035 _a(MiAaPQ)EBC31471650
035 _a(Au-PeEL)EBL31471650
035 _a(OCoLC)1439601709
040 _aMiAaPQ
_beng
_erda
_epn
_cMiAaPQ
_dMiAaPQ
050 4 _aTK7867-7867.5
082 0 _a621.3815
100 1 _aGolshan, Khosrow.
245 1 0 _aASIC Design Implementation Process :
_bA Complete Framework.
250 _a1st ed.
264 1 _aCham :
_bSpringer,
_c2024.
264 4 _c�2024.
300 _a1 online resource (143 pages)
336 _atext
_btxt
_2rdacontent
337 _acomputer
_bc
_2rdamedia
338 _aonline resource
_bcr
_2rdacarrier
505 0 _aIntro -- Foreword -- Trademarks -- Preface -- Acknowledgments -- Disclaimer -- Contents -- About the Author -- Chapter 1: Design Requirements -- 1.1 Specifications -- 1.2 Architecture -- 1.3 Initial Design -- 1.4 Summary -- References -- Chapter 2: Design Validation -- 2.1 FPGA Design -- 2.2 FPGA Programming -- 2.3 Reference Board Design -- 2.4 Hardware and Software Validation -- 2.5 Summary -- References -- Chapter 3: Design Synthesis -- 3.1 Timing Constraints -- 3.2 Optimization Constraints -- 3.3 Design Rule Constraints -- 3.4 Summary -- References -- Chapter 4: Physical Design -- 4.1 Floorplanning -- 4.2 Placement -- 4.3 Clock Tree Synthesis -- 4.4 Routing -- 4.5 Summary -- References -- Chapter 5: Design Verification -- 5.1 Functional Verification -- 5.2 Timing Verification -- 5.3 Physical Verification -- 5.4 Summary -- References -- Chapter 6: ASIC Testing -- 6.1 Functional Test -- 6.2 Scan Test -- 6.3 Boundary Scan Test -- 6.4 Fault Detection -- 6.5 Parametric Test -- 6.6 Current and Very Low-Level Voltage Test -- 6.7 Built-In-Self-Test -- 6.8 Parallel Module Test -- 6.9 System Test -- 6.10 Summary -- References -- Chapter 7: ASIC Qualification -- 7.1 Electro-Static Discharge Test -- 7.2 Latch-up Test -- 7.3 Wafer Acceptance Test -- 7.4 Summary -- References -- Index.
588 _aDescription based on publisher supplied metadata and other sources.
590 _aElectronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2025. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries.
655 4 _aElectronic books.
776 0 8 _iPrint version:
_aGolshan, Khosrow
_tASIC Design Implementation Process
_dCham : Springer,c2024
_z9783031586521
797 2 _aProQuest (Firm)
856 4 0 _uhttps://ebookcentral-proquest-com.mlisicats.remotexs.co/lib/ppks/detail.action?docID=31471650&query=9783031586538
_zClick to View
942 _2lcc
_cEB
999 _c1964
_d1964