000 | 02857nam a22004093i 4500 | ||
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001 | EBC31471650 | ||
003 | MiAaPQ | ||
005 | 20250825095851.0 | ||
006 | m o d | | ||
007 | cr cnu|||||||| | ||
008 | 250807s2024 xx o ||||0 eng d | ||
020 |
_a9783031586538 _q(electronic bk.) |
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020 | _z9783031586521 | ||
035 | _a(MiAaPQ)EBC31471650 | ||
035 | _a(Au-PeEL)EBL31471650 | ||
035 | _a(OCoLC)1439601709 | ||
040 |
_aMiAaPQ _beng _erda _epn _cMiAaPQ _dMiAaPQ |
||
050 | 4 | _aTK7867-7867.5 | |
082 | 0 | _a621.3815 | |
100 | 1 | _aGolshan, Khosrow. | |
245 | 1 | 0 |
_aASIC Design Implementation Process : _bA Complete Framework. |
250 | _a1st ed. | ||
264 | 1 |
_aCham : _bSpringer, _c2024. |
|
264 | 4 | _c�2024. | |
300 | _a1 online resource (143 pages) | ||
336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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505 | 0 | _aIntro -- Foreword -- Trademarks -- Preface -- Acknowledgments -- Disclaimer -- Contents -- About the Author -- Chapter 1: Design Requirements -- 1.1 Specifications -- 1.2 Architecture -- 1.3 Initial Design -- 1.4 Summary -- References -- Chapter 2: Design Validation -- 2.1 FPGA Design -- 2.2 FPGA Programming -- 2.3 Reference Board Design -- 2.4 Hardware and Software Validation -- 2.5 Summary -- References -- Chapter 3: Design Synthesis -- 3.1 Timing Constraints -- 3.2 Optimization Constraints -- 3.3 Design Rule Constraints -- 3.4 Summary -- References -- Chapter 4: Physical Design -- 4.1 Floorplanning -- 4.2 Placement -- 4.3 Clock Tree Synthesis -- 4.4 Routing -- 4.5 Summary -- References -- Chapter 5: Design Verification -- 5.1 Functional Verification -- 5.2 Timing Verification -- 5.3 Physical Verification -- 5.4 Summary -- References -- Chapter 6: ASIC Testing -- 6.1 Functional Test -- 6.2 Scan Test -- 6.3 Boundary Scan Test -- 6.4 Fault Detection -- 6.5 Parametric Test -- 6.6 Current and Very Low-Level Voltage Test -- 6.7 Built-In-Self-Test -- 6.8 Parallel Module Test -- 6.9 System Test -- 6.10 Summary -- References -- Chapter 7: ASIC Qualification -- 7.1 Electro-Static Discharge Test -- 7.2 Latch-up Test -- 7.3 Wafer Acceptance Test -- 7.4 Summary -- References -- Index. | |
588 | _aDescription based on publisher supplied metadata and other sources. | ||
590 | _aElectronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2025. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries. | ||
655 | 4 | _aElectronic books. | |
776 | 0 | 8 |
_iPrint version: _aGolshan, Khosrow _tASIC Design Implementation Process _dCham : Springer,c2024 _z9783031586521 |
797 | 2 | _aProQuest (Firm) | |
856 | 4 | 0 |
_uhttps://ebookcentral-proquest-com.mlisicats.remotexs.co/lib/ppks/detail.action?docID=31471650&query=9783031586538 _zClick to View |
942 |
_2lcc _cEB |
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999 |
_c1964 _d1964 |