000 | 08856nam a22004693i 4500 | ||
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001 | EBC31596004 | ||
003 | MiAaPQ | ||
005 | 20250825105322.0 | ||
006 | m o d | | ||
007 | cr cnu|||||||| | ||
008 | 250807s2024 xx o ||||0 eng d | ||
020 |
_a9783031627071 _q(electronic bk.) |
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020 | _z9783031627064 | ||
035 | _a(MiAaPQ)EBC31596004 | ||
035 | _a(Au-PeEL)EBL31596004 | ||
035 | _a(OCoLC)1452755613 | ||
040 |
_aMiAaPQ _beng _erda _epn _cMiAaPQ _dMiAaPQ |
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050 | 4 | _aTK7867-7867.5 | |
082 | 0 | _a621.3815 | |
100 | 1 | _aAtallah, Jad G. | |
245 | 1 | 0 | _aIntegrated Electronic Circuits. |
250 | _a1st ed. | ||
264 | 1 |
_aCham : _bSpringer International Publishing AG, _c2024. |
|
264 | 4 | _c�2024. | |
300 | _a1 online resource (363 pages) | ||
336 |
_atext _btxt _2rdacontent |
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337 |
_acomputer _bc _2rdamedia |
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338 |
_aonline resource _bcr _2rdacarrier |
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505 | 0 | _aIntro -- Preface -- Abbreviations -- Contents -- Chapter 1: Circuits and Signals -- 1.1 Sample Applications -- 1.1.1 Embedded System with Sensors and Actuators -- 1.1.2 Power Supply: AC-DC Conversion -- 1.1.3 Communications -- 1.2 Information Content in Signals -- 1.3 Voltage and Current Domains -- 1.4 Vertical Circuits -- 1.5 Unit Conversion and Logarithmic Scales -- 1.6 Feedback Basics -- 1.7 Miller�s Theorem -- Chapter 2: Basic Applications -- 2.1 Regarding Specifications -- 2.2 Amplify -- 2.2.1 Regular Amplifiers -- 2.2.1.1 Behavioral Modeling -- 2.2.1.2 Non-idealities -- 2.2.2 Operational Amplifiers and Operational Transconductance Amplifiers -- 2.2.2.1 Behavioral Modeling -- 2.2.2.2 Basic Configurations -- 2.3 Filter -- 2.3.1 General Description -- 2.3.2 Specifications -- 2.3.3 Transfer Function and Implementation -- 2.3.3.1 Low-Pass Filter -- 2.3.3.2 High-Pass Filter -- 2.3.3.3 General Filter -- 2.3.3.4 All-Pass Filter -- 2.4 Switch and Compute -- Chapter 3: Diodes -- 3.1 Diode Models -- 3.1.1 Forward Region Diode Models -- 3.1.1.1 Diode Model 1: Constant-Voltage Drop (C-VD) Model -- 3.1.1.2 Diode Model 2: Variable-Voltage Drop (V-VD) Model -- 3.1.1.3 Diode Model 3: Exponential Model -- 3.1.2 Reverse and Breakdown Regions Diode Model -- 3.1.3 Additional Notes Regarding the Diode Modeling -- 3.1.3.1 Temperature Effects -- 3.1.3.2 Capacitive Effects -- 3.2 Diode Applications -- 3.2.1 Clipping -- 3.2.2 Rectification -- 3.2.2.1 Half-Wave Rectifier -- 3.2.2.2 Bridge Rectifier -- 3.2.2.3 Peak Rectifier -- 3.2.3 Clamped Capacitor (DC Restorer) -- 3.2.4 AC-to-DC Voltage Multiplication -- 3.2.5 DC-to-DC Conversion -- 3.2.5.1 Buck-Boost Converter -- 3.2.5.2 Dickson Charge Pump -- 3.2.6 DC Voltage Stabilization -- 3.2.7 Lighting -- 3.2.8 Photodetection -- 3.2.9 Electrostatic Discharge (ESD) Protection -- 3.2.10 Temperature Measurements. | |
505 | 8 | _a3.2.11 Variable Capacitance -- Chapter 4: Transistors -- 4.1 Transistor Models -- 4.2 Transistor Example 1: MOSFET -- 4.2.1 MOSFET Large-Signal Model -- 4.2.1.1 MOSFET Large-Signal Model: Saturation Region -- 4.2.1.2 MOSFET Large-Signal Model: Triode Region -- 4.2.2 MOSFET Small-Signal Model -- 4.2.2.1 MOSFET Small-Signal Model: Saturation Region -- 4.2.2.2 MOSFET Small-Signal Model: Triode Region -- 4.3 Transistor Example 2: BJT -- 4.3.1 BJT Large-Signal Model: Forward Active Region -- 4.3.2 BJT Small-Signal Model: Forward Active Region -- 4.4 Transistor Characterization -- 4.4.1 Large-Signal Parameters -- 4.4.2 Small-Signal Parameters -- 4.5 Basic Circuits and Applications -- 4.5.1 Switches -- 4.5.2 Logic Gates -- 4.5.3 Resistors: Small Signal -- 4.5.4 Current Sources -- 4.5.5 Diodes -- 4.5.6 Amplifiers: Small Signal -- 4.5.7 Capacitors -- 4.5.8 Active Inductors -- 4.5.9 Negative Capacitances and Inductances -- Chapter 5: Technology and Limitations -- 5.1 System Overview -- 5.2 IC Overview -- 5.3 Integrated Devices -- 5.4 Semiconductor Manufacturing and the Foundry Ecosystem -- 5.5 Process Variations and Corners -- 5.6 Parasitics, Electromigration, and IR Drop -- 5.7 Reliability and Aging -- 5.8 Past, Present, and Future Trends -- Chapter 6: IC Design Flow -- 6.1 Design Flow -- 6.2 Transistor Models -- 6.3 Corner and Statistical Simulations -- 6.4 Implementation Considerations -- 6.4.1 Dealing with Connection Parasitics -- 6.4.2 Splitting a Transistor into Fingers -- 6.4.3 Matching Devices -- 6.4.4 Shielding and Guard Rings -- Chapter 7: Single-Ended Amplifiers -- 7.1 Introduction -- 7.2 Common-Source (CS) Configuration -- 7.2.1 Common-Source DC Analysis -- 7.2.2 Common-Source AC Small-Signal Analysis -- 7.3 Common-Gate (CG) Configuration -- 7.3.1 Common-Gate DC Analysis -- 7.3.2 Common-Gate AC Small-Signal Analysis. | |
505 | 8 | _a7.4 Common-Drain (CD) Configuration -- 7.4.1 Common-Drain DC Analysis -- 7.4.2 Common-Drain AC Small-Signal Analysis -- 7.5 Performance Summary -- 7.6 Cascaded Amplifiers and Transistor Pairing -- 7.6.1 Example 1: 2-Stage Cascade -- 7.6.2 Example 2: 3-Stage Cascade -- 7.6.3 Example 3: 2-Stage Vertical Cascade (Cascode) -- 7.6.4 Example 4: BJT Transistor Pairing -- 7.6.5 Example 5: MOSFET- BJT Transistor Pairing -- Chapter 8: Logic Circuits -- 8.1 Introduction to Logic Circuit Families -- 8.2 General Properties -- 8.2.1 Voltage-Transfer Characteristic -- 8.2.2 Transition Time -- 8.2.3 Noise Margins -- 8.2.4 Power Consumption: Dynamic -- 8.3 Static Logic -- 8.3.1 Ratioed Logic -- 8.3.1.1 Ratioed Logic: Voltage-Transfer Characteristic -- 8.3.1.2 Ratioed Logic: Transition Time -- 8.3.1.3 Ratioed Logic: Sample Gates -- 8.3.2 Complementary (CMOS) Logic -- 8.3.2.1 CMOS Logic: Voltage-Transfer Characteristic -- 8.3.2.2 CMOS Logic: Transition Time -- 8.3.2.3 CMOS Logic: Sample Gates -- 8.3.3 Pass-Transistor Logic -- 8.4 Dynamic Logic -- Chapter 9: Differential Structures -- 9.1 Electrical Noise -- 9.2 Introduction to Differential Structures -- 9.3 Differential Amplifiers -- 9.3.1 Differential-to-Differential Amplifier -- 9.3.1.1 Common-Mode DC Behavior (Biasing Point) -- 9.3.1.2 Common-Mode AC Small-Signal Behavior (Noise) -- 9.3.1.3 Differential-Mode Small-Signal Behavior (Data) -- 9.3.1.4 Behavior in the Presence of Mismatches -- 9.3.1.5 Output Common-Mode Stabilization -- 9.3.2 Differential-to-Single-Ended Amplifier -- 9.3.2.1 Common-Mode AC Small-Signal Behavior (Noise) -- 9.3.2.2 Differential-Mode Small-Signal Behavior -- 9.4 Differential Logic Circuits -- Chapter 10: Voltage Regulators and Converters, Reference and Bias Circuits -- 10.1 Power Distribution Overview -- 10.2 Voltage Regulators and Converters -- 10.2.1 Linear Voltage Regulators. | |
505 | 8 | _a10.2.2 Switching Converters (With Inductors) -- 10.2.2.1 Buck Converters -- 10.2.2.2 Boost Converters -- 10.2.2.3 Buck-Boost Converters -- 10.2.3 Switched-Capacitor Converters (Without Inductors) -- 10.2.3.1 Buck Switched-Capacitor Converters -- 10.2.3.2 Boost Switched-Capacitor Converters -- 10.3 Reference Circuits -- 10.3.1 Simple Voltage Reference -- 10.3.2 Bandgap Voltage Reference -- 10.4 Bias Circuits -- 10.4.1 Simple Current Source -- 10.4.2 Improved Current Sources -- 10.4.3 Biasing a Complete Integrated Circuit -- 10.5 Power Distribution for Digital Circuits -- Chapter 11: Output Stages -- 11.1 Introduction -- 11.2 Performance Parameters -- 11.3 Classes: Introduction -- 11.4 Class A -- 11.4.1 Class A Output and Input Voltage Range -- 11.4.2 Class A Transfer Characteristic and Linearity -- 11.4.3 Class A Power Consumption, Power Dissipation, and Efficiency -- 11.5 Class B -- 11.5.1 Class B Output and Input Voltage Range -- 11.5.2 Class B Transfer Characteristic and Linearity -- 11.5.3 Class B Power Consumption, Power Dissipation, and Efficiency -- 11.6 Class AB -- 11.6.1 Class AB Output and Input Voltage Range -- 11.6.2 Class AB Transfer Characteristic and Linearity -- 11.6.3 Class AB Power Consumption, Power Dissipation, and Efficiency -- Chapter 12: Mixed-Signal Circuits -- 12.1 Comparators -- 12.2 Switched-Capacitor Circuits -- 12.3 Sample-and-Hold Circuits -- 12.4 Data Converters -- 12.4.1 Digital-to-Analog Converters -- 12.4.2 Analog-to-Digital Converters -- 12.5 Oscillators and Phase-Locked Loops -- Correction to: Transistors -- Index. | |
588 | _aDescription based on publisher supplied metadata and other sources. | ||
590 | _aElectronic reproduction. Ann Arbor, Michigan : ProQuest Ebook Central, 2025. Available via World Wide Web. Access may be limited to ProQuest Ebook Central affiliated libraries. | ||
650 | 0 | _aElectronic circuits. | |
655 | 4 | _aElectronic books. | |
700 | 1 | _aIsmail, Mohammed. | |
776 | 0 | 8 |
_iPrint version: _aAtallah, Jad G. _tIntegrated Electronic Circuits _dCham : Springer International Publishing AG,c2024 _z9783031627064 |
797 | 2 | _aProQuest (Firm) | |
856 | 4 | 0 |
_uhttps://ebookcentral-proquest-com.mlisicats.remotexs.co/lib/ppks/detail.action?docID=31596004&query=9783031627071 _zClick to View |
942 |
_2lcc _cEB |
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999 |
_c1966 _d1966 |