000 01342cam a2200409 a 4500
001 653525
003 OSt
005 20260123103024.0
008 940624s1995 enka b 001 0 eng
010 _a 94029098
020 _a0470234458
020 _a0582237793
_qEngland
020 _a9780470234457
020 _a9780582237797
_q(England)
035 _a653525
040 _aDLC
_cDLC
_dDLC
050 0 0 _aQC53
_b.B44 1995
082 0 0 _a530.8
_220
100 1 _aBentley, John P.,
_d1943-
245 1 0 _aPrinciples of measurement systems /
_cJohn P. Bentley.
246 3 0 _aMeasurement systems
250 _a3rd ed.
260 _aHarlow [England] :
_bLongman Scientific & Technical ;
_aNew York, NY :
_bWiley,
_c1995.
300 _axi, 468 p. :
_bill. ;
_c25 cm.
336 _atext
_btxt
_2rdacontent
337 _aunmediated
_bn
_2rdamedia
338 _avolume
_bnc
_2rdacarrier
500 _aIncludes index.
650 0 _aPhysical instruments.
650 0 _aPhysical measurements.
650 0 _aEngineering instruments.
650 0 _aAutomatic control.
906 _a7
_bcbc
_corignew
_d1
_eocip
_f19
_gy-gencatlg
942 _2lcc
_cBOOKS
999 _c2376
_d2376